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in stockReleased: 2025-10
DIN EN IEC 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur (IEC 47/2881/CDV:2024); Deutsche und Englische Fassung prEN IEC 60749-23:2024
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English PDF
Immediate download
Printable
79.73 EUR
English Hardcopy
In stock
79.73 EUR
German PDF
Immediate download
Printable
79.73 EUR
German Hardcopy
In stock
79.73 EUR
| Status: | Draft |
| Released: | 2025-10 |
| Standard number: | DIN EN IEC 60749-23 |
| Name: | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024 |
| Pages: | 18 |
DESCRIPTION