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>IEC Standards>IEC 60191-6-16:2007 - Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
immediate downloadReleased: 2007-04-26
IEC 60191-6-16:2007 - Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

IEC 60191-6-16:2007

Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-16: Glossaire des supports de test et de déverminage pour les BGA, LGA, FBGA et FLGA

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English/French - Bilingual PDF
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English/French - Bilingual Hardcopy
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View table of Contents
Standard number:IEC 60191-6-16:2007
Released:2007-04-26
Edition:1
ICS:31.080.01
Pages (English/French - Bilingual):21
ISBN (English/French - Bilingual):9782832202333
Pages (English):11
ISBN (English):2831891310
DESCRIPTION

IEC 60191-6-16:2007

IEC 60191-6-16:2007 gives a glossary of semiconductor sockets for BGA, LGA, FBGA and FLGA. This standard intends to establish definitions and unification of terminology relating to tests and burn-in sockets for BGA, LGA, FBGA and FLGA.