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>IEC Standards>IEC 60749-1:2002/COR1:2003 - Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
immediate downloadReleased: 2003-08-12
IEC 60749-1:2002/COR1:2003 - Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

IEC 60749-1:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 1: Généralités

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Standard number:IEC 60749-1:2002/COR1:2003
Released:2003-08-12
Edition:1
ICS:31.080.01
Pages (English/French - Bilingual):0
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IEC 60749-1:2002/COR1:2003

Modification of the validity date: now put at 2007.

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