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Homepage>IEC Standards>IEC 60749-14:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
immediate downloadReleased: 2003-08-07
IEC 60749-14:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

IEC 60749-14:2003

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 14: Robustesse des sorties (integrité des connexions)

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English/French - Bilingual PDF
Immediate download
86.40 EUR
English/French - Bilingual Hardcopy
in stock
86.40 EUR
Standard number:IEC 60749-14:2003
Released:2003-08-07
Edition:1
ICS:31.080.01
Pages (English/French - Bilingual):27
ISBN (English/French - Bilingual):2831871328
DESCRIPTION

IEC 60749-14:2003

Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly. Applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.

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