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Homepage>IEC Standards>IEC 60749-27:2006/AMD1:2012 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
download between 0-24 hoursReleased: 2012-09-25
IEC 60749-27:2006/AMD1:2012 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

IEC 60749-27:2006/AMD1:2012

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)

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English/French - Bilingual PDF
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10.80 EUR
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Standard number:IEC 60749-27:2006/AMD1:2012
Released:2012-09-25
Edition:2
ICS:31.080.01
Pages (English/French - Bilingual):5
ISBN (English/French - Bilingual):9782832203415
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IEC 60749-27:2006/AMD1:2012

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