IEC 60749-30:2020 RLV
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
| Standard number: | IEC 60749-30:2020 RLV | 
| Released: | 2020-08-17 | 
| Edition: | 2 | 
| ICS: | 31.080.01 | 
| Pages (English): | 41 | 
| ISBN (English): | 9782832287774 | 
IEC 60749-30:2020 RLV
IEC 60749-30:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
 The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
 These SMDs are subjected to the appropriate preconditioning sequence described in this document prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress). This edition includes the following significant technical changes with respect to the previous edition:
 - inclusion of new Clause 3;
 - expansion of 6.7 on solder reflow;
 - inclusion of explanatory notes and clarifications.
