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download between 0-24 hoursReleased: 2003-02-13
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 36: Accélération constante
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English/French - Bilingual PDF
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| Standard number: | IEC 60749-36:2003 |
| Released: | 2003-02-13 |
| Edition: | 1 |
| ICS: | 31.080.01 |
| Pages (English/French - Bilingual): | 7 |
| ISBN (English/French - Bilingual): | 2831868580 |
DESCRIPTION
IEC 60749-36:2003
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.