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Homepage>IEC Standards>IEC 60749-41:2020 - Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
download between 0-24 hoursReleased: 2020-07-22
IEC 60749-41:2020 - Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 41: Méthodes d’essai normalisées pour la fiabilité des dispositifs à mémoire non volatile

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Standard number:IEC 60749-41:2020
Released:2020-07-22
Edition:1
ICS:31.080.01
Pages (English/French - Bilingual):44
ISBN (English/French - Bilingual):9782832286401
DESCRIPTION

IEC 60749-41:2020

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

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