PRICES include / exclude VAT
immediate downloadReleased: 1983-01-01
IEC 60759:1983
Standard test procedures for semiconductor X-ray energy spectrometers
Méthodes d'essais normalisés des spectromètres d'énergie X à semicteur
Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
Printable
302.40 EUR
English/French - Bilingual Hardcopy
in stock
302.40 EUR
| Standard number: | IEC 60759:1983 |
| Released: | 1983-01-01 |
| Edition: | 1 |
| ICS: | 17.240 |
| Pages (English/French - Bilingual): | 97 |
| ISBN (English/French - Bilingual): | 2831809274 |
DESCRIPTION
IEC 60759:1983
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.