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immediate downloadReleased: 2012-06-21
IEC 61445:2012
Digital Test Interchange Format (DTIF)
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| Standard number: | IEC 61445:2012 |
| Released: | 2012-06-21 |
| Edition: | 1 |
| ICS: | 25.040.01 |
| Pages (English): | 101 |
| ISBN (English): | 9782832201053 |
DESCRIPTION
IEC 61445:2012
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.