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>IEC Standards>IEC 62047-40:2021 - Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
immediate downloadReleased: 2021-09-03
IEC 62047-40:2021 - Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

IEC 62047-40:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

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Standard number:IEC 62047-40:2021
Released:2021-09-03
Edition:1
ICS:31.080.99
Pages (English):11
ISBN (English):9782832251737
DESCRIPTION

IEC 62047-40:2021

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

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