Don't have a credit card? Never mind we support BANK TRANSFER .

Log inSign up
LANGUAGE en
Menu
STOREHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>IEC Standards>IEC 62132-2:2010 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
download between 0-24 hoursReleased: 2010-03-30
IEC 62132-2:2010 - Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

IEC 62132-2:2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

Circuits intégrés - Mesure de l'immunité electromagnétique - Partie 2: Mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande

Format
Availability
Price and currency
English/French - Bilingual PDF
Immediate download
167.40 EUR
English/French - Bilingual Hardcopy
in stock
167.40 EUR
Standard number:IEC 62132-2:2010
Released:2010-03-30
Edition:1
ICS:31.200
Pages (English/French - Bilingual):49
ISBN (English/French - Bilingual):9782889106240
DESCRIPTION

IEC 62132-2:2010

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

Print