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Homepage>IEC Standards>IEC 62899-503-1:2020 - Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
download between 0-24 hoursReleased: 2020-05-27
IEC 62899-503-1:2020 - Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

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Standard number:IEC 62899-503-1:2020
Released:2020-05-27
Edition:1
ICS:29.045
Pages (English):15
ISBN (English):9782832283783
DESCRIPTION

IEC 62899-503-1:2020

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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