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immediate downloadReleased: 2025-11-28
IEC 63616:2025
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
Mesurage de la conductivité des films minces métalliques aux hyperfréquences et aux fréquences à ondes millimétriques - Méthode du résonateur à disque circulaire de type symétrique
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English Hardcopy
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86.40 EUR
English/French - Bilingual PDF
Immediate download
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86.40 EUR
English/French - Bilingual Hardcopy
in stock
86.40 EUR
| Standard number: | IEC 63616:2025 |
| Released: | 2025-11-28 |
| Edition: | 1 |
| ICS: | 17.220.20 |
| Pages (English/French - Bilingual): | 26 |
| ISBN (English/French - Bilingual): | 9782832708941 |
DESCRIPTION
IEC 63616:2025
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.