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IEC 60512-17-4:2010
Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion
Released: 2010-06-10
English/French - Bilingual PDF
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21.60 EUR
English/French - Bilingual Hardcopy
in stock
21.60 EUR
English/French - Bilingual PDF
Immediate download
124.20 EUR
English/French - Bilingual Hardcopy
in stock
124.20 EUR
IEC 61746-2:2010
Calibration of optical time-domain reflectometers (OTDR) - Part 2: OTDR for multimode fibres
Calibration of optical time-domain reflectometers (OTDR) - Part 2: OTDR for multimode fibres
Released: 2010-06-21
English PDF
Immediate download
302.40 EUR
English Hardcopy
in stock
302.40 EUR
English/French - Bilingual PDF
Immediate download
302.40 EUR
English/French - Bilingual Hardcopy
in stock
302.40 EUR
IEC 62523:2010
Radiation protection instrumentation - Cargo/vehicle radiographic inspection system
Radiation protection instrumentation - Cargo/vehicle radiographic inspection system
Released: 2010-06-21
English/French - Bilingual PDF
Immediate download
167.40 EUR
English/French - Bilingual Hardcopy
in stock
167.40 EUR
IEC 61169-35:2011
Radio-frequency connectors - Part 35: Sectional specification for 2,92 series RF connectors
Radio-frequency connectors - Part 35: Sectional specification for 2,92 series RF connectors
Released: 2011-07-11
English/French - Bilingual PDF
Immediate download
167.40 EUR
English/French - Bilingual Hardcopy
in stock
167.40 EUR
IEC 61788-6:2011
Superconductivity - Part 6: Mechanical properties measurement - Room temperature tensile test of Cu/Nb-Ti composite superconductors
Superconductivity - Part 6: Mechanical properties measurement - Room temperature tensile test of Cu/Nb-Ti composite superconductors
Released: 2011-07-11
English/French - Bilingual PDF
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270.00 EUR
English/French - Bilingual Hardcopy
in stock
270.00 EUR
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Released: 2011-07-13
English/French - Bilingual PDF
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167.40 EUR
English/French - Bilingual Hardcopy
in stock
167.40 EUR
IEC 60068-2-45:1980/AMD1:1993
Amendment 1 - Basic environmental testing procedures - Part 2-45: Tests - Test XA and guidance: Immersion in cleaning solvents
Amendment 1 - Basic environmental testing procedures - Part 2-45: Tests - Test XA and guidance: Immersion in cleaning solvents
Released: 1993-02-15
English/French - Bilingual PDF
Immediate download
10.80 EUR
English/French - Bilingual Hardcopy
in stock
10.80 EUR
IEC 62386-203:2009
Digital addressable lighting interface - Part 203: Particular requirements for control gear - Discharge lamps (excluding fluorescent lamps) (device type 2)
Digital addressable lighting interface - Part 203: Particular requirements for control gear - Discharge lamps (excluding fluorescent lamps) (device type 2)
Released: 2009-06-09
English/French - Bilingual PDF
Immediate download
216.00 EUR
English/French - Bilingual Hardcopy
in stock
216.00 EUR
English/French - Bilingual PDF
Immediate download
43.20 EUR
English/French - Bilingual Hardcopy
in stock
43.20 EUR
IEC 61169-39:2009
Radio-frequency connectors - Part 39: Sectional specification for CQM series quick lock RF connectors
Radio-frequency connectors - Part 39: Sectional specification for CQM series quick lock RF connectors
Released: 2009-06-16
English/French - Bilingual PDF
Immediate download
216.00 EUR
English/French - Bilingual Hardcopy
in stock
216.00 EUR
English/French - Bilingual PDF
Immediate download
270.00 EUR
English/French - Bilingual Hardcopy
in stock
270.00 EUR