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IEC 61671-5:2016
Standard for automatic test markup language (ATML) test adapter description
Standard for automatic test markup language (ATML) test adapter description
Released: 2016-04-08
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IEC TS 62607-6-23:2025
Nanomanufacturing - Key control characteristics - Part 6-23: Graphene-related products - Sheet resistance, carrier density, carrier mobility: Hall bar method
Nanomanufacturing - Key control characteristics - Part 6-23: Graphene-related products - Sheet resistance, carrier density, carrier mobility: Hall bar method
Released: 2025-11-05
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IEC 63341-2:2025
Railway applications - Hydrogen and fuel cell systems for rolling stock - Part 2: Hydrogen fuel system
Railway applications - Hydrogen and fuel cell systems for rolling stock - Part 2: Hydrogen fuel system
Released: 2025-11-12
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IEC 60153-2:2025
Hollow metallic waveguides - Part 2: Relevant specifications for ordinary rectangular waveguides
Hollow metallic waveguides - Part 2: Relevant specifications for ordinary rectangular waveguides
Released: 2025-11-13
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195.48 EUR
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IEC 60672-1:1995
Ceramic and glass insulating materials - Part 1: Definitions and classification
Ceramic and glass insulating materials - Part 1: Definitions and classification
Released: 1995-06-27
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ISO/IEC 23090-16:2025
Information technology - Coded representation of immersive media - Part 16: Reference software for versatile video coding
Information technology - Coded representation of immersive media - Part 16: Reference software for versatile video coding
Released: 2025-11-20
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IEC 60749-11:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Released: 2003-01-30
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IEC 60749-11:2002/COR2:2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Released: 2003-08-13
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IEC 60749-32:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2003-08-13
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