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IEC 61391-1:2006
Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
Ultrasonics - Pulse-echo scanners - Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
Released: 2006-07-11
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318.60 EUR
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318.60 EUR
IEC 60191-2:1966/AMD14:2006
Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Released: 2006-07-17
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43.20 EUR
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43.20 EUR
IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 2006-07-18
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86.40 EUR
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86.40 EUR
IEC 61577-1:2006
Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles
Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles
Released: 2006-07-19
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172.80 EUR
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IEC 62308:2006
Equipment reliability - Reliability assessment methods
Equipment reliability - Reliability assessment methods
Released: 2006-07-26
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361.80 EUR
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IEC 62471:2006
Photobiological safety of lamps and lamp systems
Photobiological safety of lamps and lamp systems
Released: 2006-07-26
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318.60 EUR
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IEC 61788-10:2006
Superconductivity - Part 10: Critical temperature measurement - Critical temperature of composite superconductors by a resistance method
Superconductivity - Part 10: Critical temperature measurement - Critical temperature of composite superconductors by a resistance method
Released: 2006-08-11
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86.40 EUR
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86.40 EUR
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43.20 EUR
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43.20 EUR
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43.20 EUR
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43.20 EUR
IEC 61290-7-1:2007
Optical amplifiers - Test methods - Part 7-1: Out-of-band insertion losses - Filtered optical power meter method
Optical amplifiers - Test methods - Part 7-1: Out-of-band insertion losses - Filtered optical power meter method
Released: 2007-04-11
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43.20 EUR
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IEC 61000-2-13:2005
Electromagnetic compatibility (EMC) - Part 2-13: Environment - High-power electromagnetic (HPEM) environments - Radiated and conducted
Electromagnetic compatibility (EMC) - Part 2-13: Environment - High-power electromagnetic (HPEM) environments - Radiated and conducted
Released: 2005-03-09
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280.80 EUR
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280.80 EUR
IEC 61337-2:2004
Filters using waveguide type dielectric resonators - Part 2: Guidance for use
Filters using waveguide type dielectric resonators - Part 2: Guidance for use
Released: 2004-07-06
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226.80 EUR
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226.80 EUR
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226.80 EUR
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IEC TR 62235:2005
Nuclear facilities - Instrumentation and control systems important to safety - Systems of interim storage and final repository of nuclear fuel and waste
Nuclear facilities - Instrumentation and control systems important to safety - Systems of interim storage and final repository of nuclear fuel and waste
Released: 2005-03-17
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280.80 EUR
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280.80 EUR