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IEC 60512-11-10:2002
Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold
Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold
Released: 2002-02-21
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21.60 EUR
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in stock
21.60 EUR
IEC 60512-5-1:2002
Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
Released: 2002-02-22
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10.80 EUR
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in stock
10.80 EUR
IEC 60061-2:1969/AMD28:2003
Amendment 28 - Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 2: Lampholders
Amendment 28 - Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 2: Lampholders
Released: 2003-05-13
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43.20 EUR
English/French - Bilingual Hardcopy
in stock
43.20 EUR
IEC 60268-5:2003
Sound system equipment - Part 5: Loudspeakers
Sound system equipment - Part 5: Loudspeakers
Released: 2003-05-15
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302.40 EUR
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302.40 EUR
IEC 60061-1:1969/AMD31:2003
Amendment 31 - Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 1: Lamp caps
Amendment 31 - Lamp caps and holders together with gauges for the control of interchangeability and safety - Part 1: Lamp caps
Released: 2003-05-15
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86.40 EUR
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in stock
86.40 EUR
English/French - Bilingual PDF
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Printable
21.60 EUR
English/French - Bilingual Hardcopy
in stock
21.60 EUR
IEC 60512-4-1:2003
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof
Released: 2003-05-16
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10.80 EUR
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10.80 EUR
IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2004-03-09
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43.20 EUR
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43.20 EUR
IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 2004-03-09
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43.20 EUR
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43.20 EUR
IEC 60404-4:1995+AMD1:2000 CSV
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
Released: 2000-11-28
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383.40 EUR
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383.40 EUR
IEC 60064:1993/AMD1:2000
Amendment 1 - Tungsten filament lamps for domestic and similar general lighting purposes - Performance requirements
Amendment 1 - Tungsten filament lamps for domestic and similar general lighting purposes - Performance requirements
Released: 2000-11-28
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43.20 EUR
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43.20 EUR
IEC 62028:2002
General methods of measurement for digital television receivers
General methods of measurement for digital television receivers
Released: 2002-02-05
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302.40 EUR
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302.40 EUR