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>IEC Standards>IEC TR 63571:2025 - Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
immediate downloadReleased: 2025-05-13
IEC TR 63571:2025 - Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

IEC TR 63571:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

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Standard number:IEC TR 63571:2025
Released:2025-05-13
Edition:1
ICS:31.080.99
Pages (English):24
ISBN (English):9782832704158
DESCRIPTION

IEC TR 63571:2025

IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.