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Homepage>IEC Standards>IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
download between 0-24 hoursReleased: 2022-02-08
IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

IEC TS 62607-6-11:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

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Standard number:IEC TS 62607-6-11:2022
Released:2022-02-08
Edition:1
ICS:07.120
Pages (English):27
ISBN (English):9782832243763
DESCRIPTION

IEC TS 62607-6-11:2022

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy

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