IEC TS 62607-6-26:2025
Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
| Standard number: | IEC TS 62607-6-26:2025 |
| Released: | 2025-12-10 |
| Edition: | 1 |
| ICS: | 07.120 |
| Pages (English): | 26 |
| ISBN (English): | 9782832709108 |
IEC TS 62607-6-26:2025
IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs)
• Young's modulus (or elastic modulus),
• residual strain,
• residual stress, and
• fracture stress
of 2D materials and nanoscale films using the
• bulge test.
The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties.
• This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres.
• This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.