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>IEEE Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.30 Transistors

31.080.30 Transistors

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IEEE 1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Released: 05.12.2008
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133.65 EUR
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98.37 EUR
IEEE 1620.1-2006 - IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Released: 08.11.2006
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87.67 EUR
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79.70 EUR
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103.71 EUR
IEEE 1005-1991 - IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
Released: 17.10.1991
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98.37 EUR
IEEE 1005-1998 - IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
Released: 09.02.1999
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174.28 EUR
IEEE/IEC 62860-1-2013 - IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
Released: 30.07.2013
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148.62 EUR
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178.56 EUR
IEEE 581-1978 - IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
Released: 28.04.1978
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53.46 EUR
IEEE 1620-2004 - Standard for Test Methods for the Characterization of Organic Transistors and Materials
Standard for Test Methods for the Characterization of Organic Transistors and Materials
Released: 29.04.2004
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143.27 EUR
IEEE/IEC 62860-2013 - IEC/IEEE Test methods for the characterization of organic transistors and materials
IEC/IEEE Test methods for the characterization of organic transistors and materials
Released: 30.07.2013
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210.63 EUR
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264.09 EUR