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>ISO Standards>ISO 15625:2014-Silk — Electronic test method for defects and evenness of raw silk
immediate downloadReleased: 2014
ISO 15625:2014-Silk — Electronic test method for defects and evenness of raw silk

ISO 15625:2014

ISO 15625:2014-Silk — Electronic test method for defects and evenness of raw silk

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English PDF
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110.00 EUR
English Hardcopy
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French PDF
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French Hardcopy
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110.00 EUR
Standard´s number:ISO 15625:2014
Pages:15
Edition:1
Released:2014
DESCRIPTION

ISO 15625:2014


ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
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