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IEC 61773:1996/COR1:1997
Corrigendum 1 - Overhead lines - Testing of foundations for structures
Corrigendum 1 - Overhead lines - Testing of foundations for structures
Released: 1997-03-27
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IEC 60050-702:1992/COR2:1994
Corrigendum 2 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
Corrigendum 2 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
Released: 1994-12-01
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IEC TR 60344:2007/COR1:2012
Corrigendum 1 - Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide
Corrigendum 1 - Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide
Released: 2012-02-24
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IEC 60523:1975/AMD1:1979/COR1:1980
Corrigendum 1 to Amendment 1 - Direct-current potentiometers
Corrigendum 1 to Amendment 1 - Direct-current potentiometers
Released: 1980-12-01
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IEC 60598-2-25:1994/COR1:1994
Corrigendum 1 - Luminaires - Part 2: Particular requirements - Section 25: Luminaires for use in clinical areas of hospitals and health care buildings
Corrigendum 1 - Luminaires - Part 2: Particular requirements - Section 25: Luminaires for use in clinical areas of hospitals and health care buildings
Released: 1994-09-01
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IEC 60601-1:2005+AMD1:2012 CSV/COR1:2012
Corrigendum 1 - Medical electrical equipment - Part 1: General requirements for basic safety and essential performance
Corrigendum 1 - Medical electrical equipment - Part 1: General requirements for basic safety and essential performance
Released: 2012-11-14
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IEC 60749-11:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Released: 2003-01-30
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IEC 60749-11:2002/COR2:2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Released: 2003-08-13
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IEC 60749-32:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2003-08-13
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IEC 60945:2002/COR1:2008
Corrigendum 1 - Maritime navigation and radiocommunication equipment and systems - General requirements - Methods of testing and required test results
Corrigendum 1 - Maritime navigation and radiocommunication equipment and systems - General requirements - Methods of testing and required test results
Released: 2008-04-14
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