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Homepage>UNE standards>UNE EN 15991:2015 Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)
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in stockReleased: 2016-01-01
UNE EN 15991:2015 Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)

UNE EN 15991:2015

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)

Ensayo de materiales cerámicos y básicos. Determinación directa de las fracciones másicas de impurezas en los polvos y granos de carburo de silicio mediante espectroscopia de emisión óptica mediante plasma de acoplamiento inductivo (ICP OES) con vaporización electrotérmica (ETV) (Ratificada por AENOR en enero de 2016.)

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Standard number:UNE EN 15991:2015
Pages:27
Released:2016-01-01
DESCRIPTION
This standard UNE EN 15991:2015 Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.) is classified in these ICS categories:
  • 81.060.10
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