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>UNE standards>UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)
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in stockReleased: 2014-07-01
UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)

UNE EN 60749-26:2014

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 26: Ensayo de la sensibilidad a la descarga electrostática (ESD). Modelo del cuerpo humano (HBM) (Ratificada por AENOR en julio de 2014.)

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85.8 EUR
Standard number:UNE EN 60749-26:2014
Pages:44
Released:2014-07-01
DESCRIPTION
This standard UNE EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.) is classified in these ICS categories:
  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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