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31.080.01 Semiconductor devices in general
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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120.35 USD
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120.35 USD
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Released: 2004-05-28
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66.00 USD
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66.00 USD
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66.00 USD
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66.00 USD
UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2011-01-19
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41.41 USD
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41.41 USD
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41.41 USD
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41.41 USD
UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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89.29 USD
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89.29 USD
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89.29 USD
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89.29 USD
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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41.41 USD
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41.41 USD
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41.41 USD
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41.41 USD
English PDF
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97.06 USD
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97.06 USD
English PDF
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69.88 USD
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69.88 USD
English PDF
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84.12 USD
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84.12 USD
English PDF
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82.82 USD
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82.82 USD
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76.35 USD
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76.35 USD
UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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91.88 USD
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91.88 USD
English PDF
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69.88 USD
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69.88 USD