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31.080.01 Semiconductor devices in general
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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117.76 USD
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In stock
117.76 USD
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Released: 2004-05-28
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77.65 USD
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77.65 USD
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64.71 USD
Spanish Hardcopy
In stock
64.71 USD
UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2011-01-19
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43.48 USD
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In stock
43.48 USD
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36.24 USD
Spanish Hardcopy
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36.24 USD
UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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107.15 USD
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107.15 USD
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89.29 USD
Spanish Hardcopy
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89.29 USD
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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43.48 USD
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43.48 USD
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36.24 USD
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36.24 USD
UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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84.12 USD
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84.12 USD
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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73.76 USD
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73.76 USD
English PDF
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81.53 USD
English Hardcopy
In stock
81.53 USD
English PDF
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76.35 USD
English Hardcopy
In stock
76.35 USD
UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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88.00 USD
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88.00 USD
English PDF
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73.76 USD
English Hardcopy
In stock
73.76 USD
English PDF
Immediate download
84.12 USD
English Hardcopy
In stock
84.12 USD