Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
Sponsored link
in stockReleased: 2006-11-01
UNE EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)

UNE EN 60749-27:2006

Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 27: Ensayo de la sensibilidad de la descarga electrostática. Modelo máquina (HBM) (IEC 60749-27:2006)(Ratificada por AENOR en noviembre de 2006.)

Format
Availability
Price and currency
English PDF
Immediate download
72.11 USD
English Hardcopy
In stock
72.11 USD
Standard number:UNE EN 60749-27:2006
Pages:17
Released:2006-11-01
DESCRIPTION

This standard UNE EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
Print