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31.080.01 Semiconductor devices in general
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82.31 USD
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68.59 USD
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UNE EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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49.18 USD
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UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Released: 2010-10-01
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UNE EN 62779-1:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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98.35 USD
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75.06 USD
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2.58 USD
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77.65 USD
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