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Homepage>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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92 results
First page135678Last page
UNE EN 60191-6-1:2002
Mechanical standardization of semiconductor devices -- Part 6-1: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for gull-wing lead terminals.
Released: 2002-06-28
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77.65 USD
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77.65 USD
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64.71 USD
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64.71 USD
UNE EN 60191-6-5:2002
Mechanical standardization of semiconductor devices -- Part 6-5: General rules for the preparation of outline drawings of surface mounted semiconductor device package - Design guide for fine -pitch ball grid array (FBGA).
Released: 2002-06-28
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82.31 USD
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82.31 USD
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68.59 USD
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68.59 USD
UNE EN IEC 60749-12:2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
Released: 2018-04-01
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54.35 USD
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UNE EN 60191-6-12:2011
Mechanical standardization of semiconductor devices - Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guidelines for fine-pitch land grid array (FLGA) (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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84.12 USD
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UNE EN 60191-6-16:2007
Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)
Released: 2007-10-01
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73.76 USD
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UNE EN 60191-6:2009
Mechanical standardization of semiconductor devices -- Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (Endorsed by AENOR in April of 2010.)
Released: 2010-04-01
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98.35 USD
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98.35 USD
UNE EN 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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75.06 USD
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75.06 USD
UNE EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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59.53 USD
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59.53 USD
UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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49.18 USD
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49.18 USD
UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Released: 2010-10-01
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81.53 USD
UNE EN 62779-1:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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81.53 USD
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81.53 USD
UNE EN IEC 60747-17:2020/AC:2021-02
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
Released: 2021-03-01
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2.58 USD
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92 results
First page135678Last page