PRICES include / exclude VAT
in stockReleased: 2018-04-01
UNE EN IEC 60749-12:2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 12: Vibraciones, frecuencias variables. (Ratificada por la Asociación Española de Normalización en abril de 2018.)
Format
Availability
Price and currency
English PDF
Immediate download
Printable
62.12 USD
English Hardcopy
In stock
62.12 USD
| Standard number: | UNE EN IEC 60749-12:2018 |
| Pages: | 15 |
| Released: | 2018-04-01 |
| Status: | Standard |
DESCRIPTION
UNE EN IEC 60749-12:2018
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.