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in stockReleased: 2011-11-01
UNE EN 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 40: Método de ensayo de caída al nivel de la plataforma mediante la utilización de galgas extensométricas (Ratificada por AENOR en noviembre de 2011.)
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| Standard number: | UNE EN 60749-40:2011 |
| Pages: | 26 |
| Released: | 2011-11-01 |
DESCRIPTION
This standard UNE EN 60749-40:2011 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.) is classified in these ICS categories:
- 31.080.01