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31.080.01 Semiconductor devices in general
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UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
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54.35 USD
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54.35 USD
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45.29 USD
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45.29 USD
UNE EN 60749-34:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Released: 2011-07-20
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91.62 USD
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91.62 USD
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76.35 USD
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76.35 USD
UNE EN 60749-36:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Released: 2004-03-18
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54.35 USD
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54.35 USD
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45.29 USD
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45.29 USD
UNE EN 60191-3:2001
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Released: 2001-01-31
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166.16 USD
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166.16 USD
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138.47 USD
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138.47 USD
UNE EN IEC 60749-13:2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Released: 2018-05-01
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81.53 USD
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81.53 USD
English PDF
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81.53 USD
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81.53 USD
English PDF
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84.12 USD
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84.12 USD
English PDF
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84.12 USD
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84.12 USD
English PDF
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76.35 USD
English Hardcopy
In stock
76.35 USD
English PDF
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81.53 USD
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In stock
81.53 USD
English PDF
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128.12 USD
English Hardcopy
In stock
128.12 USD
English PDF
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76.35 USD
English Hardcopy
In stock
76.35 USD