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31.080.01 Semiconductor devices in general
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UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Released: 2010-10-01
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77.00 USD
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77.00 USD
UNE EN 62779-1:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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77.00 USD
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77.00 USD
English PDF
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77.00 USD
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In stock
77.00 USD
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72.11 USD
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72.11 USD
English PDF
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92.89 USD
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In stock
92.89 USD
English PDF
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116.11 USD
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116.11 USD
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2.43 USD
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2.43 USD
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
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117.33 USD
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117.33 USD
English PDF
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73.33 USD
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In stock
73.33 USD
English PDF
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51.33 USD
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In stock
51.33 USD
UNE EN IEC 60749-13:2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Released: 2018-05-01
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77.00 USD
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In stock
77.00 USD
English PDF
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73.33 USD
English Hardcopy
In stock
73.33 USD