PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
English PDF
Immediate download
Printable
141.06 USD
English Hardcopy
In stock
141.06 USD
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
English PDF
Immediate download
Printable
81.53 USD
English Hardcopy
In stock
81.53 USD
Spanish PDF
Immediate download
Printable
81.53 USD
Spanish Hardcopy
In stock
81.53 USD
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
English PDF
Immediate download
Printable
46.59 USD
English Hardcopy
In stock
46.59 USD
Spanish PDF
Immediate download
Printable
46.59 USD
Spanish Hardcopy
In stock
46.59 USD
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
English PDF
Immediate download
Printable
53.06 USD
English Hardcopy
In stock
53.06 USD
Spanish PDF
Immediate download
Printable
53.06 USD
Spanish Hardcopy
In stock
53.06 USD
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
English PDF
Immediate download
Printable
62.12 USD
English Hardcopy
In stock
62.12 USD
Spanish PDF
Immediate download
Printable
62.12 USD
Spanish Hardcopy
In stock
62.12 USD
UNE EN 60749-32:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2004-03-18
English PDF
Immediate download
Printable
46.59 USD
English Hardcopy
In stock
46.59 USD
Spanish PDF
Immediate download
Printable
46.59 USD
Spanish Hardcopy
In stock
46.59 USD
UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
English PDF
Immediate download
Printable
46.59 USD
English Hardcopy
In stock
46.59 USD
Spanish PDF
Immediate download
Printable
46.59 USD
Spanish Hardcopy
In stock
46.59 USD
UNE EN 60749-34:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Released: 2011-07-20
English PDF
Immediate download
Printable
78.94 USD
English Hardcopy
In stock
78.94 USD
Spanish PDF
Immediate download
Printable
78.94 USD
Spanish Hardcopy
In stock
78.94 USD
UNE EN 60749-36:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Released: 2004-03-18
English PDF
Immediate download
Printable
46.59 USD
English Hardcopy
In stock
46.59 USD
Spanish PDF
Immediate download
Printable
46.59 USD
Spanish Hardcopy
In stock
46.59 USD
English PDF
Immediate download
Printable
72.47 USD
English Hardcopy
In stock
72.47 USD
English PDF
Immediate download
Printable
85.41 USD
English Hardcopy
In stock
85.41 USD
English PDF
Immediate download
Printable
102.24 USD
English Hardcopy
In stock
102.24 USD