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Homepage>UNE standards>UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
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in stockReleased: 2003-05-30
UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

UNE EN 60749-2:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 2: Baja presión atmosférica.

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Standard number:UNE EN 60749-2:2003
Pages:19
Released:2003-05-30
DESCRIPTION

This standard UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure. is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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