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in stockReleased: 2003-05-30
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 2: Baja presión atmosférica.
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English PDF
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53.06 USD
English Hardcopy
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53.06 USD
Spanish PDF
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53.06 USD
Spanish Hardcopy
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53.06 USD
| Standard number: | UNE EN 60749-2:2003 |
| Pages: | 19 |
| Released: | 2003-05-30 |
| Status: | Standard |
| Pages (Spanish): | 10 |
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