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Homepage>UNE standards>UNE EN 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
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in stockReleased: 2005-03-16
UNE EN 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST

UNE EN 60749-24:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 24: Resistencia a la humedad acelerada. HAST no polarizado.

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Standard number:UNE EN 60749-24:2005
Pages:19
Released:2005-03-16
DESCRIPTION

This standard UNE EN 60749-24:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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