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>UNE standards>UNE EN 60749-36:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
in stockReleased: 2004-03-18
UNE EN 60749-36:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

UNE EN 60749-36:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 36: Aceleración constante.

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Spanish Hardcopy
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Standard number:UNE EN 60749-36:2004
Pages:15
Released:2004-03-18
Status:Standard
Pages (Spanish):8
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UNE EN 60749-36:2004