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31.080.01 Semiconductor devices in general
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69.67 USD
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69.67 USD
UNE EN 60749-8:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Released: 2004-05-28
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88.00 USD
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88.00 USD
Spanish PDF
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73.33 USD
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73.33 USD
UNE EN 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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51.33 USD
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51.33 USD
UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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139.33 USD
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139.33 USD
UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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79.44 USD
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79.44 USD
UNE EN 61975:2010/A2:2022
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
Released: 2023-01-01
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56.22 USD
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56.22 USD
English PDF
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90.44 USD
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90.44 USD
English PDF
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34.22 USD
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34.22 USD
UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Released: 2009-06-01
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92.89 USD
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92.89 USD
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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69.67 USD
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69.67 USD
UNE EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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56.22 USD
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56.22 USD
UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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46.44 USD
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46.44 USD