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31.080.01 Semiconductor devices in general
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19.41 USD
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19.41 USD
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88.00 USD
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88.00 USD
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54.35 USD
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54.35 USD
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73.76 USD
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73.76 USD
UNE EN 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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54.35 USD
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81.53 USD
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81.53 USD
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Released: 2003-11-21
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72.99 USD
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72.99 USD
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60.82 USD
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60.82 USD
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91.62 USD
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91.62 USD
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76.35 USD
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76.35 USD
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90.07 USD
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90.07 USD
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75.06 USD
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75.06 USD
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91.62 USD
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91.62 USD
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76.35 USD
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76.35 USD
English PDF
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90.07 USD
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90.07 USD
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75.06 USD
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75.06 USD
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
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124.24 USD
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124.24 USD