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31.080.01 Semiconductor devices in general
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UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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168.24 USD
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168.24 USD
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94.47 USD
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94.47 USD
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97.06 USD
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97.06 USD
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78.94 USD
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78.94 USD
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23.29 USD
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23.29 USD
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90.59 USD
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90.59 USD
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62.12 USD
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62.12 USD
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69.88 USD
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69.88 USD
UNE EN 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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62.12 USD
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62.12 USD
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84.12 USD
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UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Released: 2003-11-21
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62.12 USD
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62.12 USD
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62.12 USD
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62.12 USD
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78.94 USD
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78.94 USD
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78.94 USD
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78.94 USD