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in stockReleased: 2011-12-01
UNE EN 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 7: Medición del contenido de humedad interna y análisis de otros gases residuales. (Ratificada por AENOR en diciembre de 2011.)
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| Standard number: | UNE EN 60749-7:2011 |
| Pages: | 14 |
| Released: | 2011-12-01 |
DESCRIPTION
This standard UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.) is classified in these ICS categories:
- 31.080.01