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in stockReleased: 2003-11-21
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 16: Detección del ruido de impacto de partículas (PIND).
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English PDF
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62.12 USD
English Hardcopy
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62.12 USD
Spanish PDF
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62.12 USD
Spanish Hardcopy
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62.12 USD
| Standard number: | UNE EN 60749-16:2003 |
| Pages: | 20 |
| Released: | 2003-11-21 |
| Status: | Standard |
| Pages (Spanish): | 10 |
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