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Homepage>UNE standards>UNE EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
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in stockReleased: 2003-11-21
UNE EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)

UNE EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 16: Detección del ruido de impacto de partículas (PIND).

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Standard number:UNE EN 60749-16:2003
Pages:20
Released:2003-11-21
DESCRIPTION

This standard UNE EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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