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Main page>UNE standards>UNE EN 60749-16:2003 - Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
in stockReleased: 2003-11-21
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 16: Detección del ruido de impacto de partículas (PIND).
