PRICES include / exclude VAT
Sponsored link
in stockReleased: 2013-01-01
UNE EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 27: Ensayo de la sensibilidad de la descarga electrostática. Modelo máquina (HBM) (Ratificada por AENOR en enero de 2013.)
Format
Availability
Price and currency
English PDF
Immediate download
18.33 USD
English Hardcopy
In stock
18.33 USD
| Standard number: | UNE EN 60749-27:2006/A1:2012 |
| Pages: | 11 |
| Released: | 2013-01-01 |
DESCRIPTION
This standard UNE EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.) is classified in these ICS categories:
- 31.080.01