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31.080.01 Semiconductor devices in general
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UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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88.00 USD
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88.00 USD
UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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85.41 USD
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85.41 USD
Spanish PDF
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71.17 USD
Spanish Hardcopy
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71.17 USD
UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2005-03-16
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59.01 USD
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59.01 USD
Spanish PDF
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49.17 USD
Spanish Hardcopy
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49.17 USD
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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35.72 USD
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35.72 USD
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29.76 USD
Spanish Hardcopy
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29.76 USD
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
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54.35 USD
English Hardcopy
In stock
54.35 USD
Spanish PDF
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45.29 USD
Spanish Hardcopy
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45.29 USD
UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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77.65 USD
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77.65 USD
Spanish PDF
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64.71 USD
Spanish Hardcopy
In stock
64.71 USD
English PDF
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76.35 USD
English Hardcopy
In stock
76.35 USD
English PDF
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19.41 USD
English Hardcopy
In stock
19.41 USD
English PDF
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103.53 USD
English Hardcopy
In stock
103.53 USD
UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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88.00 USD
English Hardcopy
In stock
88.00 USD
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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48.15 USD
English Hardcopy
In stock
48.15 USD
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40.12 USD
Spanish Hardcopy
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40.12 USD
UNE EN 60749-30:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 2005-11-02
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82.31 USD
English Hardcopy
In stock
82.31 USD
Spanish PDF
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68.59 USD
Spanish Hardcopy
In stock
68.59 USD