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31.080.01 Semiconductor devices in general
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2.58 USD
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2.58 USD
UNE 21302-521:2004
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
Released: 2004-05-21
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173.41 USD
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173.41 USD
UNE EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Released: 2003-05-30
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72.99 USD
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72.99 USD
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60.82 USD
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60.82 USD
UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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91.62 USD
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91.62 USD
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76.35 USD
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76.35 USD
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 2004-03-18
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43.48 USD
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43.48 USD
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36.24 USD
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36.24 USD
UNE EN 60749-8:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Released: 2004-05-28
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96.28 USD
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96.28 USD
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80.24 USD
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80.24 USD
English PDF
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98.35 USD
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98.35 USD
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89.29 USD
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89.29 USD
UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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147.53 USD
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147.53 USD
English PDF
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89.29 USD
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89.29 USD
English PDF
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90.59 USD
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90.59 USD
English PDF
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77.65 USD
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77.65 USD