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31.080.01 Semiconductor devices in general
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UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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85.07 USD
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85.07 USD
Spanish PDF
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70.89 USD
Spanish Hardcopy
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70.89 USD
English PDF
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72.11 USD
English Hardcopy
In stock
72.11 USD
English PDF
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18.33 USD
English Hardcopy
In stock
18.33 USD
English PDF
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97.78 USD
English Hardcopy
In stock
97.78 USD
UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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83.11 USD
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83.11 USD
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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57.20 USD
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57.20 USD
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47.67 USD
Spanish Hardcopy
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47.67 USD
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 2004-03-18
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39.60 USD
English Hardcopy
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39.60 USD
Spanish PDF
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33.00 USD
Spanish Hardcopy
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33.00 USD
UNE EN 60749-32:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2004-03-18
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49.87 USD
English Hardcopy
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49.87 USD
Spanish PDF
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41.56 USD
Spanish Hardcopy
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41.56 USD
UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
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49.87 USD
English Hardcopy
In stock
49.87 USD
Spanish PDF
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41.56 USD
Spanish Hardcopy
In stock
41.56 USD
UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 2005-03-16
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57.20 USD
English Hardcopy
In stock
57.20 USD
Spanish PDF
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47.67 USD
Spanish Hardcopy
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47.67 USD
UNE EN 60749-34:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Released: 2011-07-20
English PDF
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85.07 USD
English Hardcopy
In stock
85.07 USD
Spanish PDF
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70.89 USD
Spanish Hardcopy
In stock
70.89 USD
English PDF
Immediate download
83.11 USD
English Hardcopy
In stock
83.11 USD