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in stockReleased: 2003-05-30
UNE EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 11: Variaciones rápidas de temperatura. Método de los dos baños.
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| Standard number: | UNE EN 60749-11:2003 |
| Pages: | 21 |
| Released: | 2003-05-30 |
DESCRIPTION
This standard UNE EN 60749-11:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method. is classified in these ICS categories:
- 31.080.01