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in stockReleased: 2004-03-18
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 31: Inflamabilidad de dispositivos con encapsulado plástico (provocada internamente).
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English PDF
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39.60 USD
English Hardcopy
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Spanish PDF
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33.00 USD
Spanish Hardcopy
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| Standard number: | UNE EN 60749-31:2004 |
| Pages: | 16 |
| Released: | 2004-03-18 |
DESCRIPTION
This standard UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced) is classified in these ICS categories:
- 31.080.01