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31.080.01 Semiconductor devices in general
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UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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84.12 USD
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84.12 USD
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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73.76 USD
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73.76 USD
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81.53 USD
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81.53 USD
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112.59 USD
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112.59 USD
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122.94 USD
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122.94 USD
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90.59 USD
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90.59 USD
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77.65 USD
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77.65 USD
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89.29 USD
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89.29 USD
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82.82 USD
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82.82 USD
UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2005-03-16
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77.65 USD
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77.65 USD
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64.71 USD
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64.71 USD
UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 2005-03-16
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62.12 USD
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62.12 USD
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51.76 USD
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51.76 USD
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77.65 USD
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77.65 USD
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64.71 USD
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64.71 USD