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31.080.01 Semiconductor devices in general
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UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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91.88 USD
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91.88 USD
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69.88 USD
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69.88 USD
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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69.88 USD
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69.88 USD
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78.94 USD
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78.94 USD
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94.47 USD
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94.47 USD
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72.47 USD
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72.47 USD
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112.59 USD
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112.59 USD
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152.71 USD
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152.71 USD
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125.53 USD
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125.53 USD
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85.41 USD
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85.41 USD
UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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86.71 USD
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86.71 USD
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139.76 USD
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139.76 USD