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in stockReleased: 2004-06-11
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 14: Robustez de los terminales (integridad de los conectores).
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| Standard number: | UNE EN 60749-14:2004 |
| Pages: | 35 |
| Released: | 2004-06-11 |
DESCRIPTION
This standard UNE EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity) is classified in these ICS categories:
- 31.080.01