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in stockReleased: 2011-01-19
UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 19: Resistencia de la pastilla al cizallamiento.
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39.60 USD
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33.00 USD
Spanish Hardcopy
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| Standard number: | UNE EN 60749-19:2003/A1:2011 |
| Pages: | 12 |
| Released: | 2011-01-19 |
DESCRIPTION
This standard UNE EN 60749-19:2003/A1:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength is classified in these ICS categories:
- 31.080.01