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in stockReleased: 2004-05-28
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 1: Generalidades.
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| Standard number: | UNE EN 60749-1:2004 |
| Pages: | 24 |
| Released: | 2004-05-28 |
DESCRIPTION
This standard UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General is classified in these ICS categories:
- 31.080.01