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in stockReleased: 2011-12-21
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
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English PDF
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39.60 USD
English Hardcopy
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39.60 USD
Spanish PDF
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33.00 USD
Spanish Hardcopy
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33.00 USD
Standard number: | UNE EN 60749-23:2005/A1:2011 |
Pages: | 14 |
Released: | 2011-12-21 |
DESCRIPTION
This standard UNE EN 60749-23:2005/A1:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life is classified in these ICS categories:
- 31.080.01