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Main page>UNE standards>UNE EN 60749-23:2005/A1:2011 - Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
in stockReleased: 2011-12-21
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
