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UNE EN 60749-37:2008
Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 37: Método de ensayo de caida a nivel de tarjeta para componentes usando un acelerómetro. (Ratificada por AENOR en julio de 2008.)
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| Standard number: | UNE EN 60749-37:2008 |
| Pages: | 23 |
| Released: | 2008-07-01 |
DESCRIPTION
This standard UNE EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.) is classified in these ICS categories:
- 31.080.01