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>UNE standards>UNE EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
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in stockReleased: 2017-08-01
UNE EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)

UNE EN 60749-28:2017

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 28: Ensayo de la sensibilidad a la descarga electrostática. Modelo de dispositivo cargado- Nivel de dispositivo. (Ratificada por la Asociación Española de Normalización en agosto de 2017.)

CURRENCY
88 EUR
Standard number:UNE EN 60749-28:2017
Pages:52
Released:2017-08-01
Status:Standard
DESCRIPTION

This standard UNE EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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